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Kartik K. Kumara
Kartik K. Kumara
TSMC
Real-time computing
Fault coverage
Image stitching
Scan chain
Electronic engineering
3
Papers
18
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Diagnosis and Layout Aware (DLA) Scan Chain Stitching
2015
IEEE Transactions on Very Large Scale Integration Systems
Jing Ye
Yu Huang
Yu Hu
Wu-Tung Cheng
Ruifeng Guo
Liyang Lai
Ting-Pu Tai
Xiaowei Li
Wei-Pin Changchien
Daw-Ming Lee
Ji-Jan Chen
Sandeep C. Eruvathi
Kartik K. Kumara
Charles C. C. Liu
Sam Pan
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Citations (13)
Diagnosis and Layout Aware (DLA) scan chain stitching
2013
ITC | International Test Conference
Jing Ye
Yu Huang
Yu Hu
Wu-Tung Cheng
Ruifeng Guo
Liyang Lai
Ting-Pu Tai
Xiaowei Li
Wei-Pin Changchien
Daw-Ming Lee
Ji-Jan Chen
Sandeep C. Eruvathi
Kartik K. Kumara
Charles C. C. Liu
Sam Pan
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Citations (5)
Diagnosis and Layout Aware (DLA) scan chain stitching
2013
ITC | International Test Conference
Jing Ye
Yu Huang
Yu Hu
Wu-Tung Cheng
Rui-feng Guo
Liyang Lai
Ting-Pu Tai
Xiaowei Li
Wei-Pin Changchien
Daw-Ming Lee
Ji-Jan Chen
Sandeep C. Eruvathi
Kartik K. Kumara
Charles Liu
Sam Pan
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