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C. Scozzari
C. Scozzari
STMicroelectronics
Electronic engineering
Oxide
Dielectric
Engineering
Voltage
4
Papers
8
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A1 2 O 3 optimization for Charge Trap memory application
2008
ULIS | International Conference on Ultimate Integration on Silicon
C. Scozzari
G. Albini
M. Alessandri
Salvatore Maria Amoroso
P. Bacciaglia
A. Del Vitto
G. Ghidini
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Citations (5)
High voltage transistor degradation in NVM pump application
2007
Microelectronics Reliability
Roberta Bottini
Sonia Costantini
Nadia Galbiati
Andrea Ghetti
G. Ghidini
A. Mauri
C. Scozzari
A. Sebastiani
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Methodology for Word Line-Contact Dielectric Characterization in Flash Normemories
2007
IRPS | International Reliability Physics Symposium
G. Ghidini
Roberta Bottini
M. Brambilla
Daniela Brazzelli
Nadia Galbiati
Andrea Ghetti
A. Mauri
C. Scozzari
A. Sebastiani
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Oxide Reliability: a new Methodology for Reliability Evaluation at Parametric Testing
2006
IIRW | International Integrated Reliability Workshop
Roberta Bottini
A. Sebastiani
Nadia Galbiati
C. Scozzari
G. Ghidini
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Citations (3)
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