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Optimization of the Reliability of 0.25 μm n-MOSFETs
Optimization of the Reliability of 0.25 μm n-MOSFETs
1996
Hessler
Okhonin
Dutoit
Keywords:
Reliability engineering
Impact ionization
mosfet circuits
degradation
Electrical resistance and conductance
Medical simulation
Reliability (semiconductor)
Stress (mechanics)
Materials science
Correction
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