Elemental and bond mapping of complex nanostructures by MLS analysis of EELS spectrum-imaging data

The huge and increasing interest in nano-structures has stimulated the development of appropriate characterisation methods in order better to understand (and thus exploit) their properties in possible applications. Electron Energy Loss Spectroscopy (EELS) is an exceptionally useful analytical technique in this regard. In particular, the spectrumimaging (SPIM) mode [1], which retains the full energy and spatial resolution of the technique, permits the mapping of a material’s electronic properties at a resolution of less than 1 nm [2].