Calibration of the loop probe for the near-field measurement

Accurate near-field measurements of either deterministic or stochastic electromagnetic fields require a relevant process that removes the influence of the probes, transmission lines and measurement circuits on the measurement results. The main part of the experimental work presented in this paper is related to a calibration procedure of a test setup consisting of a microstrip test structure and the scanning magnetic loop probe. The calibration characteristic is obtained through comparing measured and simulated results of the same structure. The characteristic is then used to convert measured voltage into the magnetic field across and along the microstrip line at the specific height above it. A good agreement between measured data with calibration and simulated results is obtained.