Old Web
English
Sign In
Acemap
>
Paper
>
Near‐Field Characterization of Graphene Plasmons by Photo‐Induced Force Microscopy
Near‐Field Characterization of Graphene Plasmons by Photo‐Induced Force Microscopy
2018
Jianxun Liu
Sung Park
Derek Nowak
Mengchuan Tian
Yanqing Wu
Hua Long
Kai Wang
Bing Wang
Peixiang Lu
Keywords:
Plasmon
Optics
Graphene
Near and far field
Microscopy
Physics
Optoelectronics
Correction
Source
Cite
Save
Machine Reading By IdeaReader
40
References
14
Citations
NaN
KQI
[]