Effect of RF power on structural and magnetic properties of La doped Bi2Fe4O9 thin films

Effect of RF power on structural and magnetic properties of lanthanum (La3+) doped Bi2Fe4O9 thin films grown on p-Si substrates by radio frequency (RF) magnetron sputtering has studied in this investigation. It is observed that the sputtering power affects the crystalline nature and magnetic properties of grown thin films. X-ray diffraction and Raman spectrum confirms that the Bi2Fe4O9 (BFO) thin films were crystallized well with orthorhombic structure. The BFO thin films which was prepared at sputtering power of 100 W have good crystallinity than those prepared at 40 W. The magnetic properties are investigated by vibrating sample magnetometer. The magnetic hysteresis perceptive loop shows that the anti-ferromagnetic behavior of the sample at room temperature. These results confirms that the crystallinity and magnetic properties of the BFO thin films were enhanced at the higher sputtering power (100 W).