Old Web
English
Sign In
Acemap
>
Paper
>
Device Reliability and Repeatability of a High Performance Si/SiGe HBT BiCMOS Technology
Device Reliability and Repeatability of a High Performance Si/SiGe HBT BiCMOS Technology
1998
Ahlgren
Hueckel
Freeman
Walter
Groves
Ting
Vayshenker
Hostetter
Keywords:
Heterojunction bipolar transistor
Reliability (semiconductor)
bicmos technology
Optoelectronics
bicmos integrated circuits
Repeatability
Silicon-germanium
CMOS
Materials science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]