Old Web
English
Sign In
Acemap
>
Paper
>
Current Development Status and Future Challenges of Charge-Trapping NAND Flash
Current Development Status and Future Challenges of Charge-Trapping NAND Flash
2010
H. T. Lue
K. Y. Hsieh
C. Y. Lu
Keywords:
NAND gate
Nanotechnology
Electronic engineering
Materials science
Trapping
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]