Imaging with gated microchannel plate intensifier camera systems in radiation environments

Radiation Imaging diagnostics invariably utilize gated micro-channel plate intensified components matted to solid state camera systems. Imaging is accomplished by conversion of radiation patterns to light which is viewed by optical sensors. This paper describes the effects of transient ionizing radiation directly impinging upon the solid state photo sensors which are typically used in the camera systems. These spurious radiation effects can cause degradation of the camera image. Gamma and neutron studies from earlier work are reviewed as well as electronic and electro-optic mitigation techniques to alleviate the problems of unwanted induced radiation artifacts in these photo sensors. Characterization of the true optical gating properties of the gated micro-channel plate operated in the nanosecond region (which aids image capture in pulse radiation scenarios) is described. X-Ray radiography imaging with large format gated intensified camera systems using high energy pulsed sources in the MeV region is also described.