An Optimized Test During Burn-In for Automotive SoC

Davide Appello,Conrad Bugeja,Giorgio Pollaccia,Paolo Bernardi,Riccardo Cantoro,Marco Restifo,Ernesto Sanchez,Federico Venini

An Optimized Test During Burn-In for Automotive SoC

2018

Davide Appello
Conrad Bugeja
Giorgio Pollaccia
Paolo Bernardi
Riccardo Cantoro
Marco Restifo
Ernesto Sanchez
Federico Venini

Early life failures have to be excluded to fulfill the high reliability needs of automotive electronics. While burn-in test may be an effective technique, it is also a very significant cost factor. This article presents strategies for stress test parallelization. —Hans-Joachim Wunderlich, Universitat Stuttgart

Keywords:

Logic gate
Automotive engineering
Computer engineering
Automotive electronics
Factor cost
Wunderlich
Burn-in
Computer science
Automotive industry
Reliability engineering
Stress test
early life
Electronic engineering
random access memory

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