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Conrad Bugeja
Conrad Bugeja
STMicroelectronics
Burn-in
Electronic engineering
Real-time computing
Computer science
Reliability engineering
3
Papers
3
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0
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An Optimized Test During Burn-In for Automotive SoC
2018
IEEE Design & Test of Computers
Davide Appello
Conrad Bugeja
Giorgio Pollaccia
Paolo Bernardi
Riccardo Cantoro
Marco Restifo
Ernesto Sanchez
Federico Venini
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Citations (3)
Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC
2018
Journal of Electronic Testing
Davide Appello
Paolo Bernardi
Conrad Bugeja
Riccardo Cantoro
Giorgio Pollaccia
Marco Restifo
Federico Venini
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An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In
2018
Journal of Low Power Electronics
Davide Appello
Paolo Bernardi
Conrad Bugeja
Riccardo Cantoro
Andrea Colazzo
Alessandro Motta
Alberto Pagani
Giorgio Pollaccia
Marco Restifo
Ernesto Sánchez
Federico Venini
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