Effect of gate-length shortening on the terahertz small-signal and self-oscillations characteristics of field-effect transistors

Abstract We investigate the shortening of the gate-length in submicrometric and nanometric field-effect transistors as a powerful tool to improve their self-oscillations performances in the terahertz frequency region due to the appearance of the Dyakonov–Shur instability. The theoretical model is based on the numerical solution of hydrodynamic equations for the electron transport in FETs/HEMTs channels. We show that a decrease of the gate length allows, on the one hand, to increase the intrinsic resonant frequencies near 1 THz and, on the other hand, to improve the conditions for the onset of the Dyakonov–Shur instability and related phenomena. The small-signal characteristics calculated under constant drain-voltage operation are compared with the drain-voltage self-oscillations calculated under constant drain-current operation.