A NEW MESHLESS FRAGILE POINTS METHOD (FPM) WITH MINIMUM UNKNOWNS AT EACH POINT, FOR FLEXOELECTRIC ANALYSIS UNDER TWO THEORIES WITH CRACK PROPAGATION II: VALIDATION AND DISCUSSION

In the first part of this two-paper series, a new Fragile Points Method (FPM), in both primal and mixed formulations, is presented for analyzing flexoelectric effects in 2D dielectric materials. In the present paper, a number of numerical results are provided as validations, including linear and quadratic patch tests, flexoelectric effects in continuous domains, and analyses of stationary cracks in dielectric materials. A discussion of the influence of the electroelastic stress is also given, showing that Maxwell stress could be significant and thus the full flexoelectric theory is recommended to be employed for nano-scale structures. The present primal as well as mixed FPMs also show their suitability and effectiveness in simulating crack initiation and propagation with flexoelectric effect. Flexoelectricity, coupled with piezoelectric effect, can help, hinder, or deflect the crack propagation paths and should not be neglected in nano-scale crack analysis. In FPM, no remeshing or trial function enhancement are required in modeling crack propagation. A new Bonding-Energy-Rate(BER)-based crack criterion as well as classic stress-based criterion are used for crack development simulations. Other complex problems such as dynamic crack developments, fracture, fragmentation and 3D flexoelectric analyses will be given in our future studies.