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Nano-scaled transistor reliability characterization at nano-second regime
Nano-scaled transistor reliability characterization at nano-second regime
2021
Ran Cheng
Ying Sun
Yiming Qu
Wei Liu
Fanyu Liu
Jianfeng Gao
Nuo Xu
Bing Chen
Keywords:
Reliability (semiconductor)
Transistor
Materials science
Optoelectronics
characterization
Nano-
Correction
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