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Backside Anti-Reflecting Absorbing Layer Microscopy for in Situ Graphene Imaging and Modification
Backside Anti-Reflecting Absorbing Layer Microscopy for in Situ Graphene Imaging and Modification
2016
Stephane Campidelli
Renaud Cornut
Vincent Derycke
Dominique Ausserré
Keywords:
Graphene
Microscopy
In situ
Analytical chemistry
Materials science
Nanotechnology
Optics
Correction
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