Real-space characterization of tetragonal CuO epitaxial films

It is widely believed that the undoped Mott insulator is crucial to understand the origin of high-TC superconductivity and the complex phase diagram in cuprates. Tetragonal CuO, the simplest structure among cuprates, is regarded as an archetypal model to explore the ground state physics of Mott insulator. Here, we report on the epitaxial growth and surface characterization of tetragonal CuO thin film by combining ozone-assisted molecular beam epitaxy and multi-analytical techniques. In situ scanning tunneling microscopy measurement reveals two sets of Cu2+ square lattices with a reversed contrast of their apparent heights between neighboring domains. A spectroscopy study demonstrates an upper bound of the charge transfer gap as 3.68 eV, and quantitatively agrees with the previous photoemission and x-ray photoelectron results. Our work will deepen the understanding of high-energy electronic structures in parent cuprates.