PVT growth of exfoliated CdZnTe polycrystalline thick films based on stress mismatch mechanism

The exfoliated CdZnTe (CZT) films were grown on quartz substrates by closed tube physical vapor transport method based on stress mismatch mechanism. The structure and morphology of the exfoliated CZT thick films were characterized by X-ray diffraction and scanning electron microscope. The as-grown CZT films are polycrystalline with (111) preferential orientation and exhibit a dense pyramid surface structure and a thickness of more than 600 μm. The coplanar and planar X-ray detectors were fabricated based on the exfoliated CZT film. The discrepant dark resistivity is 3.17 × 109 and 5.14 × 1010 Ω cm with regard to the coplanar and planar structure detector, respectively. The planar structure detector exhibits higher quantum efficiency at low doses X-ray radiation.