Old Web
English
Sign In
Acemap
>
Paper
>
Optical Measurement Of Internal Logic Patterns In A Flip-chip Mounted Silicon SRAM Integrated Circuit
Optical Measurement Of Internal Logic Patterns In A Flip-chip Mounted Silicon SRAM Integrated Circuit
1992
H.K. Heinrich
N. Pakdaman
J.L. Prince
G. Jordy
M Belaidi
R. Franch
D. C. Edelstein
Keywords:
Electronic circuit
Silicon photonics
Photonic integrated circuit
Optoelectronics
Physics
Optical modulation amplitude
Optical transistor
Flip chip
Optics
Integrated circuit
Optical switch
Waveguide (optics)
Correction
Source
Cite
Save
Machine Reading By IdeaReader
7
References
0
Citations
NaN
KQI
[]