Crack defect control of mid-infrared film

2016 
the film crack defect is described in details, DOE conducted on different factors of material, substrate temperature and stack design, successfully delivered infrared film products to volume production.
    • Correction
    • Source
    • Cite
    • Save
    • Machine Reading By IdeaReader
    0
    References
    0
    Citations
    NaN
    KQI
    []