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Advanced TEM Techniques for Mechanisms and Reliability Analysis in State-of-the-Art OxRAM and PCM Non-Volatile Memory Devices
Advanced TEM Techniques for Mechanisms and Reliability Analysis in State-of-the-Art OxRAM and PCM Non-Volatile Memory Devices
2020
Gauthier Lefevre
Nicolas Guillaume
Anna Lisa Serra
Sylvain David
C. Vallée
Nicolas Bernier
Guillaume Bourgeois
Christelle Charpin Nicolle
Virginie Beugin
Marie-Claire Cyrille
Gabriele Navarro
Keywords:
Embedded system
Computer science
Non-volatile memory
Correction
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