Compendium of current single event effects results from NASA goddard space flight center and NASA electronic parts and packaging program

Martha V. OBryan,Kenneth A. LaBel,Edward P. Wilcox,Dakai Chen,Michael J. Campola,Megan C. Casey,Jean-Marie Lauenstein,Edward J. Wyrwas,Steven M. Guertin,Jonathan A. Pellish,Melanie D. Berg

Compendium of current single event effects results from NASA goddard space flight center and NASA electronic parts and packaging program

2017

Martha V. OBryan
Kenneth A. LaBel
Edward P. Wilcox
Dakai Chen
Michael J. Campola
Megan C. Casey
Jean-Marie Lauenstein
Edward J. Wyrwas
Steven M. Guertin
Jonathan A. Pellish
Melanie D. Berg

We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.

Keywords:

Electrical engineering
Engineering
Avionics
Electronic packaging
Simulation
Compendium
Radiation
Aerospace engineering
Electronics
spacecraft electronics

Correction
Source
Cite
Save
Machine Reading By IdeaReader

References

Citations