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In-situ Observation of Structural Change and Failure Detection for Electrically Active Devices in TEM
In-situ Observation of Structural Change and Failure Detection for Electrically Active Devices in TEM
2007
Y Kim
D.-S. Ko
S. D. Kim
Xs Li
Gyeong-Su Park
Yk Kim
Cg Park
Keywords:
Analytical chemistry
In situ
Structural change
Materials science
Nanotechnology
Metallurgy
Forensic engineering
active devices
Correction
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