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A method for analyzing transient processes in semiconductor devices subjected to high-power pulsed irradiation
A method for analyzing transient processes in semiconductor devices subjected to high-power pulsed irradiation
1981
V. N. Murashev
K. P. Gurov
Iu. G. Miller
Keywords:
Radiation effect
Poisson's equation
Semiconductor device
Nonlinear system
Boundary value problem
Continuity equation
Physics
Relaxation (NMR)
Electronic engineering
Transient response
Correction
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