Testing of semiconductor devices, and devices and their interpretation

According to one embodiment of the present invention comprises a method for testing a plurality of semiconductor devices, the application of a stress voltage with a peak voltage on a substrate arranged on a shielding line. The substrate has a functional circuit configuration of a semiconductor device. A Feststpannung is applied to a disposed over the adjacent line to the screen substrate first metal line. The first metal line is coupled to the functional circuitry and configured to be coupled to a high voltage node during operation. The peak voltage is greater than a maximum fixed voltage. The shielding line separates the first metal line from an adjacent second metal line, which is configured to be coupled to a low voltage node during operation. The method further comprises measuring a current through the shield wire in response to the load voltage, having passed the determination of the current through the shield of the semiconductor device, and identifying the semiconductor device as the test based on the determination.