THE EFFECT OF APPLIED STRESS ON THE POWER LOSS, DYNAMIC MAGNETOSTRICTION AND DOMAIN BEHAVIOUR OF INDIVIDUAL GRAINS OF SILICON-IRON IN A POLYCRYSTALLINE MATRIX

The power loss of individual grains of silicon-iron in a polycrystalline sample has been measured using a thermal method, and the domain wall motion studied by the Kerr magneto-optic technique. The effect of applied stresses (0 ± 7 x 106 N. m-2) on both the power loss and domain motion has been investigated. The effect of both compressive and tensile stresses applied in two perpendicular directions in the plane of the sheet on the dynamic magneto-striction has been determined. A theoretical model based on the observed domain structure has been developped to explain the experimental results ; and a verification of the proposed model has been attempted by making additional measurements.