Study of Recovery and Recrystallization of Cu after Dynamic-Loading and Conventional Deformations by XRD Line Broadening Fourier Analysis (*).

The residual lattice strain, the crystallite size, the components of Gaussian and Gauchy functions of the line profile, determined by Fourier analysis, are correlated for a better understanding of recovery and recrystallization phenomena of Cu annealed after fast and conventional deformations. The density and distribution of the dislocations in the deformed starting material strongly influence the mechanisms of intermediate and high-temperature recovery as well as those of primary recrystallization.