Structural and Magnetic Properties of Sputter-Deposited Mn–Fe–Ga Thin Films

We investigated the structural and magnetic properties of sputter-deposited Mn–Fe–Ga compounds. The crystallinity of the Mn–Fe–Ga thin films was confirmed using X-ray diffraction. X-ray reflection and atomic force microscopy measurements were utilized to investigate the surface properties, roughness, thickness, and density of the deposited Mn–Fe–Ga. Depending on the stoichiometry, as well as the used substrates [SrTiO 3 (001) and MgO (001)] or buffer layer (TiN), Mn–Fe–Ga crystallized in the cubic or the tetragonally distorted phase. Anomalous Hall effect and alternating gradient magnetometry measurements confirmed strong perpendicular magnetocrystalline anisotropy. Hard magnetic behavior was reached by tuning the composition. TiN-buffered Mn 2.7 Fe 0.3 Ga revealed sharper switching of the magnetization compared with the unbuffered layers.