Differential impedance analysis of bounded constant phase element

The technique of the Differential Impedance Analysis (DIA) is applied for the identification of the so called bounded constant phase element (BCP), which describes the impedance of a bounded homogeneous layer with finite thickness and conductivity following constant phase element (CPE) behaviour. The enhanced identification capability of DIA is approbated on two models - a BCP one and a model of a simple Faradaic reaction with similar shapes of the impedance diagrams, presented with part of a semi-circle, DIA ensures a clear distinction between the two models.