Old Web
English
Sign In
Acemap
>
Paper
>
Probabilistic machine learning for pattern recognition and design exploration
Probabilistic machine learning for pattern recognition and design exploration
2021
Kevin Cremanns
Dirk Roos
Stefan Reh
Sebastian Münstermann
Keywords:
Artificial neural network
Design of experiments
Bayesian optimization
Probabilistic logic
Machine learning
design exploration
Gaussian process
Pattern recognition (psychology)
Computer science
Artificial intelligence
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]