A simple implementation of scanning tunneling potentiometry with a standard scanning tunneling microscope
2017
In this paper, we present a technique for local measurements of the surface potential in the presence of a biasing current flow through a sample. This technique can be implemented by using standard scanning tunneling microscopy (STM) equipment. It is demonstrated that this potentiometry technique can be useful for in-situ sample characterization in ultra-high vacuum (UHV).
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