The test method to confirm robustness against condensation

This paper describes a test method to confirm the robustness of HVIGBTs (High Voltage Insulated Gate Bipolar Transistor) against dew condensation. The influence on condensation robustness was evaluated in dependency on ambient conditions applied before a condensation event. The influence of ambient conditions on the condensation robustness was first evaluated. A new cycling condensation test was proposed on the basis of the first step's result, and the acceleration factor of the cycling test was also confirmed. The accelerated cycling test is very important to reduce effort for experimental evaluation because condensation might happen some times in the field. This contribution provides us with a basis to consider HVIGBT reliability against condensation. Finally, the proposed cycling condensation test confirmed the robustness of the new generation X-series HVIGBT against condensation.