OP4: Midterm Outcome Of Ventricular Septal Defect Closure Using PFM LE VSD NIT Occluder Device In HUSM

Objective: To analyse safety, efficacy and early and mid-term follow-up results of percutenoeous closure of VSD using Pfm Le VSd nit occluder device. Background: The previous percutenoeous closure of VSD using other occluder device have been reported before, however it was complicated by complete AV block. However the data on the Pfm Le VSd nit occluder device are still limited. Methods: Between January 2008 till April 2011, 41 patients underwent percutenoeous closure of VSD at our center. All the patients were using Pfm Le VSd nit occluder device for the closure. Results: The mean age at closure was 13.2 ± 4.2-year-old (range 6 to 22-year-old). The attempt to place the device was successful in 36 patients. Total occlusion rate was 42% at completion of procedure and rising to 73% at 18 months of follow-up. No major complications except for one in which the embolisation of the device requiring removal of the device via surgical exploration. No case of AV block noted and no worsening of AR. Conclusions: Percutenoeous closure of VSD using Pfm Le VSd nit occluder device can be performed safely and successfully and can be a good alternative to surgical closure and previous VSD device.