Introduction to High-Resolution Accelerator Alignment Using X-ray Optics

A novel alignment technique utilizing the x-ray beam of a dedicated alignment undulator in conjunction with pinholes and position-sensitive detectors for positioning accelerator components in an x-ray free-electron laser will be presented. In this concept two retractable pinholes at each end of the main undulator line define a stable and reproducible x-ray beam axis (XBA). Targets are precisely positioned on the XBA using a pinhole camera technique. Position-sensitive detectors responding to both x-ray and electron beams enable the direct transfer of the position setting from the XBA to the electron beam. This system has the potential to deliver superior alignment accuracy in the micron range for target pinholes in the transverse directions over long distances. It defines the beam axis for the electron-beam-based alignment with high reproducibility. This concept complements the electron-beam-based alignment and the existing survey methods advancing the alignment accuracy of long accelerators to an unprecedented level. Further improvements of the transverse accuracy using x-ray zone plates and a concurrent measurement scheme during accelerator operation, providing real-time feedback for transverse position corrections, will be discussed.