Thermalization of X-rays in evaporated tin and bismuth films used as the absorbing materials in X-ray calorimeters

We have investigated the use of evaporated tin and bismuth films as the absorbing materials in X-ray calorimeters. When the films were deposited directly on monolithic silicon calorimeters, the output signal from both Sn and Bi devices was strongly dependent on the location of the absorption event relative to the ion-implanted thermistors, presumably indicating thermistor sensitivity to a non-thermal spectrum of phonons. With Sn films we also observed that a component of the thermalization proceeded slowly, relative to a complete thermalization reference. The thermalization function could be modified by trapping magnetic flux within the film. In order to distinguish thermalization effects in the films from the thermistor sensitivity to energetic phonons, we deposited Sn and Bi films on thin Si substrates which we then affixed to calorimeters using epoxy. With glued Sn films, we were able to attain as good as 13.6 eV resolution of 6 keV X-rays with no excess broadening of the line beyond the width of the baseline, while similarly made Bi devices showed excess broadening.