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Characterization of Cobalt Phthalocyanine Thin Film on Silicon Substrate Using Spectroscopic Ellipsometry
Characterization of Cobalt Phthalocyanine Thin Film on Silicon Substrate Using Spectroscopic Ellipsometry
2021
K.M. Al-Adamat
H.M. El-Nasser
Keywords:
spectroscopic ellipsometry
Substrate (chemistry)
Materials science
characterization
Silicon
Chemical engineering
Thin film
Cobalt phthalocyanine
Correction
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