Comparison of Diffuse Roughness Scattering from Material Reflections at 500-750 GHz

In this paper, an ultra-wideband Terahertz (THz) channel measurement campaign in the 500-750 GHz frequency band is presented. Power levels received from signal transmission by reflections off 14 different materials were measured in an indoor environment at Non-Line-of-Sight (NLoS) between the Transmitter (Tx) and Receiver (Rx), and compared to power levels received at Line-of-Sight (LoS) transmission. Frequency up-converters were used to transmit the signal using 26 dBi horn antennas at the Tx and Rx side and the signal was measured using a Vector Network Analyzer (VNA). From the data collected, the signal losses due to absorption and diffuse scattering from the rough surface of each Material Under Test (MUT) are calculated. The power delay profile (PDP) is presented, where multipath clustering due to diffuse scattering is observed for materials which have a high frequency selectivity, while less scattering and mostly specular reflection is shown for materials with low frequency selectivity.