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Depth-sensing using AFM contact-resonance imaging and spectroscopy at the nanoscale
Depth-sensing using AFM contact-resonance imaging and spectroscopy at the nanoscale
2019
Chengfu Ma
Wei Wang
Yonghu Chen
Walter Arnold
Jiaru Chu
Keywords:
Atomic force microscopy
Spectroscopy
Nanotechnology
Nanoscopic scale
Condensed matter physics
Resonance
Physics
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