Structural, surface morphology and optical properties of NiSnO3 thin films prepared using spray technique

Abstract In this paper, the authors have developed a method of preparing NiSnO 3 thin films precursors of NiO–SnO 2 complex oxide thin films with interests in photovoltaic and sensor applications. The films annealed at 450 °C were deposited on glass substrates using a chemical spray technique and investigated their physicals properties. The X-ray diffraction (XRD) analysis shows a polycrystalline nature of these films with a crystallite size of close to 50 nm. In addition, the Fourier transform infrared (FTIR) spectroscopy, XRD, Raman spectroscopy, photoluminescence and ellipsometry illustrate the appearance of perovskite NiSnO 3 while atomic force microscopy (AFM) reveals a relatively flat surface morphology.