Old Web
English
Sign In
Acemap
>
Paper
>
Progress and Challenges in Developing a Reliable Embedded ReRAM Memory for Hostile Environments.
Progress and Challenges in Developing a Reliable Embedded ReRAM Memory for Hostile Environments.
2015
Matthew Marinella
David Russell Hughart
James E. Stevens
Patrick R. Mickel
Gad S Haase
Seth Decker
Roger Apodaca
Edward S. Bielejec
Gyorgy Vizkelethy
Michael Lee McLain
Keywords:
Computer engineering
Nanotechnology
Resistive random-access memory
Computer science
Data science
Social psychology
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]