Structural, magnetic and electrical transport properties in electron-doped La0.85Hf0.15MnO3 epitaxial film

Using a pulsed laser deposition method, the electron-doped La0.85Hf0.15MnO3 (LHMO) film with the thickness of 90 nm was epitaxially grown on LaAlO3 (001) single crystal substrate. The structural, magnetic and electrical transport properties of the film have been studied comprehensively. The X-ray diffraction patterns confirm that LHMO film is of single phase, good quality and c axis orientation. The film undergoes a ferromagnetic-like ordering to paramagnetic states at T C =280 K. Moreover, a spin glass behavior observed in the film may be attributed to the strain effects. Using the percolation theory, we have analyzed the resistivity data ρ (T) of the film and given an excellent fit in the whole temperature range. Particularly, large temperature coefficient of resistance of 11.27% K− 1 has been discovered near sub-room-temperature, indicating that LHMO film could be useful for bolometric applications.