Profile imaging of surfaces and surface reactions
1989
Abstract The technique of profile imaging in the high-resolution electron microscope can be used to provide information about surfaces and surface reactions. Applications of the method to metals, oxides, semiconductors and small particles, as well as electron-beam-induced surface reactions, are reviewed. The role of image simulations and the need for ultra-high-vacuum and specimen-treatment facilities are also discussed.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
62
References
29
Citations
NaN
KQI