Deflectometry Challenges Interferometry: 3-D-Metrology from Nanometer to Meter

We will discuss deflectometry from the physicist’s and from the information theoretical point of view. The intrinsic features of deflectometry -incoherence, source encoding, high dynamical range, simplicity, and scalability- enable new sensors and unexpected applications. (Digital Holography and Three-Dimensional Imaging, 2009). Download original .PDF file here: