Pool-Frenkel emission and hopping conduction in semiconducting carbon nanotube transistor

The effect of using EBL with devices incorporating CNT has also been investigated. The effect on metallic and semiconducting CNT exposure in the channel of the transistor devices was examined and a physical mechanism for the variations discussed. We show that the subsequent generation of trap states along the CNT channel varies the conduction mechanism of the nanotube and has a significant effect on device performance. Metallic and semiconducting CNT react very differently, with an apparent increased localization effect in the metallic tubes responsible for dramatic decreases in conductance.