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Correction to Profiling Nanowire Thermal Resistance with a Spatial Resolution of Nanometers
Correction to Profiling Nanowire Thermal Resistance with a Spatial Resolution of Nanometers
2014
Dan Liu
Rongguo Xie
Nuo Yang
Baowen Li
John T. L. Thong
Keywords:
Nanometre
Nanowire
Analytical chemistry
Image resolution
Materials science
Thermal resistance
Profiling (computer programming)
Nanotechnology
Correction
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