IR/THZ DOUBLE RESONANCE SPECTROSCOPY IN THE PRESSURE BROADENED REGIME: A PATH TOWARDS ATMOSPHERIC GAS SENSING

Author Institution: Aegis Technologies, 410 Jan Davis Drive, Huntsville, Alabama 35806; IERUS Technologies, 2904 Westcorp Blvd, Ste 210, Huntsville, AL 35805; Department of Physics, 191 Woodruff Ave., Ohio State University, Columbus, OH 43210 ; Army Aviation and Missile RD&E Center, Redstone Arsenal, AL 35898