Smart Scattering Scanning Near-Field Optical Microscopy

Simon Labouesse,Samuel C. Johnson,Hans A. Bechtel,Markus B. Raschke,Rafael Piestun

Smart Scattering Scanning Near-Field Optical Microscopy

2020

Simon Labouesse
Samuel C. Johnson
Hans A. Bechtel
Markus B. Raschke
Rafael Piestun

Scattering scanning near-field optical microscopy (s-SNOM) provides spectroscopic imaging from molecular to quantum materials with few nanometer deep subdiffraction limited spatial resolution. Howe...

Keywords:

Near and far field
Optics
Optical microscope
Scattering
Materials science

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