Optical thickness of a plant leaf measured with THz pulse echoes
2020
We analyze Terahertz (THz) echoes by reflection on a sunflower leaf in order to evaluate the internal leaf structure (geometry, complex indices and thicknesses). The analysis is based on the thin film multilayer formalism in time and frequency domains. A high agreement is emphasized between experiment and theory, and we evaluate how realistic the multilayer solution can be in regard to our knowledge related to the sunflower leaf. A test campaign is performed in Charles Coulomb laboratory, which is equipped with the THz spectrometer.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI