Characterizing the luminescence properties of LiF crystal imaging detectors using femtosecond soft X-ray monochromatic free electron laser radiation

The monochromatic soft X-ray femtosecond pulses of the Free Electron Laser (FEL) with wavelengths of 17.2-61.5 nm were applied for measurements of optical features of point defects photoluminescence in LiF crystals. It was observed that peak of photoluminescence spectra appears near 530 nm and is associated with emission of F3+ centers. Our results suggest that a shortening of the applied laser pulses down to pico - or femtosecond duration causes redistribution of photolumi-nescence peak intensity from the red to the green part of the spectra and does not depend on the energy of EUV or X-ray photons. Dependence of peak intensity of photoluminescence spectra on the fluence of FEL radiation was measured. Even for relatively high fluencies a quenching phenomenon was not observed.