Using linear polarization for sensing and monitoring nanoparticle purity

We analyze the effect of contaminants on the quadrupolar magnetic, dipolar electric and dipolar magnetic resonances of silicon nanoparticles (NPs) by considering the spectral evolution of the linear polarization degree at right angle scattering configuration, P L (90°). From an optical point of view, a decrease in the purity of silicon nanoparticles due to the presence of contaminants impacts the NP effective refractive index. We study this effect for a silicon nanosphere of radius 200 nm embedded in different media. The weakness of the resonances induced on the P L (90°) spectrum because of the lack of purity can be used to quantify the contamination of the material. In addition, it is shown that Kerker conditions also suffer from a spectral shift, which is quantified as a function of material purity.